AFM/XPS Analysis of the Growth and Architecture of Oriented Molecular Monolayer by Spin Cast Process and Its Cross-Linking Induced by Hyperthermal Hydrogen

AFM/XPS Analysis of the Growth and Architecture of Oriented Molecular Monolayer by Spin Cast Process and Its Cross-Linking Induced by Hyperthermal Hydrogen

We used atomic force microscopy (AFM) and X-ray photoelectron spectroscopy (XPS) to comprehensively study the growth and the cross-linking of dotriacontane (C<sub>32</sub>H<sub>66</sub>) nanofilms that were deposited on a silicon wafer by the spin-coating process. It was foun...

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Bibliographic Details
Main Authors: Jinkun Liu, Run Xu, Yan Zhu, De-Quan Yang, Heng-Yong Nie, Woon Ming Lau
Format: Article
Language:English
Published: MDPI AG 2022-06-01
Series:Applied Sciences
Subjects:
C<sub>32</sub>H<sub>66</sub> nanofilm
molecular orientation
cross-linking
hyperthermal hydrogen
Online Access:https://www.mdpi.com/2076-3417/12/12/6233

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https://www.mdpi.com/2076-3417/12/12/6233

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