Entanglement meter: estimation of entanglement with single copy in interferometer

Efficient certification and quantification of high dimensional entanglement of composite systems are challenging both theoretically as well as experimentally. Here, we demonstrate how to measure the linear entropy, negativity and the Schmidt number of bipartite systems from the visibility of Mach–Ze...

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Bibliographic Details
Main Authors: Som Kanjilal, Vivek Pandey, Arun Kumar Pati
Format: Article
Language:English
Published: IOP Publishing 2023-01-01
Series:New Journal of Physics
Subjects:
Online Access:https://doi.org/10.1088/1367-2630/accd8d