Digital/Analog Performance Optimization of Vertical Nanowire FETs Using Machine Learning
Vertical nanowire field-effect transistors (NWFETs) have been optimized to maximize digital and analog performances using fully-calibrated TCAD and machine learning (ML) technique. Digital performance is quantified by RC delay (C<sub>gg</sub>V<sub>dd</sub>/I<sub>on</...
| Main Authors: | , , , |
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| Format: | Article |
| Language: | English |
| Published: |
IEEE
2021-01-01
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| Series: | IEEE Access |
| Subjects: | |
| Online Access: | https://ieeexplore.ieee.org/document/9354625/ |