Genetic Variability and Association of Yield and Yield-Related Traits under Moisture Stress in Common Bean Genotypes (Phaseolus vulgaris L.) at Melkassa and Miesso, Ethiopia

Twenty-five common bean genotypes were evaluated to assess the genetic variability, trait association, and determine the direct and indirect effects of traits on seed yield. The genotypes were grown in a lattice design at the research farm of the Melkassa Agricultural Research Center, Melkassa and M...

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Bibliografische gegevens
Hoofdauteurs: Meseret Tola, Bulti Tesso, Berhanu Amsalu
Formaat: Artikel
Taal:English
Gepubliceerd in: Hindawi Limited 2023-01-01
Reeks:Advances in Agriculture
Online toegang:http://dx.doi.org/10.1155/2023/8697497