Thermal field reconstruction based on weighted dictionary learning

Abstract Dynamic thermal management (DTM) is applied to address the thermal problem of high performance very‐large‐scale integrated chips. The false alarm rate (FAR) can be used to evaluate the impact of full‐chip thermal field reconstruction accuracy on DTM. A low FAR relies on the accurate reconst...

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Bibliographic Details
Main Authors: Tianyi Zhang, Wenchang Li, Jinyu Xiao, Jian Liu
Format: Article
Language:English
Published: Hindawi-IET 2022-05-01
Series:IET Circuits, Devices and Systems
Subjects:
Online Access:https://doi.org/10.1049/cds2.12098