On single detection test sets under replacements of gates with inverters
Detection testing of Boolean functions implemented by Boolean circuits, which are affected by single replacements of gates with inverters, was discussed. The relevance of the study is determined by the fact that replacements of gates with inverters is a type of malfunction that occurs in the develop...
| Main Authors: | , |
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| Format: | Article |
| Language: | English |
| Published: |
Kazan Federal University
2020-09-01
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| Series: | Учёные записки Казанского университета. Серия Физико-математические науки |
| Subjects: | |
| Online Access: | https://kpfu.ru/uz-eng-phm-2020-3-10.html |