Analysis and Simulation of Low-Frequency Noise in Indium-Zinc-Oxide Thin-Film Transistors

Low-frequency noise (LFN) is investigated in a set of indium-zinc-oxide thin-film transistors (IZO TFTs) with fixed channel width (<inline-formula> <tex-math notation="LaTeX">$W$ </tex-math></inline-formula> &#x003D; <inline-formula> <tex-math notation=...

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Bibliographic Details
Main Authors: Yuan Liu, Hongyu He, Rongsheng Chen, Yun-Fei En, Bin Li, Yi-Qiang Chen
Format: Article
Language:English
Published: IEEE 2018-01-01
Series:IEEE Journal of the Electron Devices Society
Subjects:
Online Access:https://ieeexplore.ieee.org/document/8277184/