Effect of Thickness of InP Nucleation Layer on the Two-Step Growth of InP on Si(001)

InP nucleation layers with different thicknesses were grown on Si(001) substrates by gas-source molecular beam epitaxy (GSMBE), and the two-step growth technique was used to overcome the large lattice mismatch (8%) between the InP nucleation layer and Si substrate. The surface morphology and microst...

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Váldodahkkit: Silu Yan, Hongliang Lv, Yuming Zhang, Shizheng Yang
Materiálatiipa: Artihkal
Giella:English
Almmustuhtton: MDPI AG 2022-03-01
Ráidu:Crystals
Fáttát:
Liŋkkat:https://www.mdpi.com/2073-4352/12/4/462
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author Silu Yan
Hongliang Lv
Yuming Zhang
Shizheng Yang
author_facet Silu Yan
Hongliang Lv
Yuming Zhang
Shizheng Yang
author_sort Silu Yan
collection DOAJ
description InP nucleation layers with different thicknesses were grown on Si(001) substrates by gas-source molecular beam epitaxy (GSMBE), and the two-step growth technique was used to overcome the large lattice mismatch (8%) between the InP nucleation layer and Si substrate. The surface morphology and microstructure were investigated by using an atomic force microscope (AFM) and transmission electron microscopy (TEM). High-resolution X-ray diffraction (HR-XRD) measurements were carried out to characterize the crystal quality. It was found that a too thin nucleation layer will lead to an uneven distribution of atoms on the surface, resulting in a poor crystalline quality of the InP epitaxial layer. The thicker the low-temperature nucleation layer is, the better the crystallization quality of the InP high-temperature layer will be.
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spelling doaj.art-c53871a60dcb4eb39a18e3744a950efb2023-12-01T01:23:40ZengMDPI AGCrystals2073-43522022-03-0112446210.3390/cryst12040462Effect of Thickness of InP Nucleation Layer on the Two-Step Growth of InP on Si(001)Silu Yan0Hongliang Lv1Yuming Zhang2Shizheng Yang3The State Key Discipline Laboratory of Wide Band Gap Semiconductor Technology, School of Microelectronics, Xidian University, Xi’an 710071, ChinaThe State Key Discipline Laboratory of Wide Band Gap Semiconductor Technology, School of Microelectronics, Xidian University, Xi’an 710071, ChinaThe State Key Discipline Laboratory of Wide Band Gap Semiconductor Technology, School of Microelectronics, Xidian University, Xi’an 710071, ChinaChina Electronic Product Reliability and Environment Testing Research Institute, Guangzhou 511370, ChinaInP nucleation layers with different thicknesses were grown on Si(001) substrates by gas-source molecular beam epitaxy (GSMBE), and the two-step growth technique was used to overcome the large lattice mismatch (8%) between the InP nucleation layer and Si substrate. The surface morphology and microstructure were investigated by using an atomic force microscope (AFM) and transmission electron microscopy (TEM). High-resolution X-ray diffraction (HR-XRD) measurements were carried out to characterize the crystal quality. It was found that a too thin nucleation layer will lead to an uneven distribution of atoms on the surface, resulting in a poor crystalline quality of the InP epitaxial layer. The thicker the low-temperature nucleation layer is, the better the crystallization quality of the InP high-temperature layer will be.https://www.mdpi.com/2073-4352/12/4/462InP on Sitwo-step growth methodnucleation layerthickness
spellingShingle Silu Yan
Hongliang Lv
Yuming Zhang
Shizheng Yang
Effect of Thickness of InP Nucleation Layer on the Two-Step Growth of InP on Si(001)
Crystals
InP on Si
two-step growth method
nucleation layer
thickness
title Effect of Thickness of InP Nucleation Layer on the Two-Step Growth of InP on Si(001)
title_full Effect of Thickness of InP Nucleation Layer on the Two-Step Growth of InP on Si(001)
title_fullStr Effect of Thickness of InP Nucleation Layer on the Two-Step Growth of InP on Si(001)
title_full_unstemmed Effect of Thickness of InP Nucleation Layer on the Two-Step Growth of InP on Si(001)
title_short Effect of Thickness of InP Nucleation Layer on the Two-Step Growth of InP on Si(001)
title_sort effect of thickness of inp nucleation layer on the two step growth of inp on si 001
topic InP on Si
two-step growth method
nucleation layer
thickness
url https://www.mdpi.com/2073-4352/12/4/462
work_keys_str_mv AT siluyan effectofthicknessofinpnucleationlayeronthetwostepgrowthofinponsi001
AT honglianglv effectofthicknessofinpnucleationlayeronthetwostepgrowthofinponsi001
AT yumingzhang effectofthicknessofinpnucleationlayeronthetwostepgrowthofinponsi001
AT shizhengyang effectofthicknessofinpnucleationlayeronthetwostepgrowthofinponsi001