Evaluating Model Fit in Two-Level Mokken Scale Analysis

Currently, two-level Mokken scale analysis for clustered test data is being developed. This paper contributes to this development by providing model-fit procedures for two-level Mokken scale analysis. New theoretical insights suggested that the existing model-fit procedure from traditional (one-leve...

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Bibliographic Details
Main Authors: Letty Koopman, Bonne J. H. Zijlstra, L. Andries Van der Ark
Format: Article
Language:English
Published: MDPI AG 2023-08-01
Series:Psych
Subjects:
Online Access:https://www.mdpi.com/2624-8611/5/3/56