Evaluating Model Fit in Two-Level Mokken Scale Analysis
Currently, two-level Mokken scale analysis for clustered test data is being developed. This paper contributes to this development by providing model-fit procedures for two-level Mokken scale analysis. New theoretical insights suggested that the existing model-fit procedure from traditional (one-leve...
Main Authors: | Letty Koopman, Bonne J. H. Zijlstra, L. Andries Van der Ark |
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Format: | Article |
Language: | English |
Published: |
MDPI AG
2023-08-01
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Series: | Psych |
Subjects: | |
Online Access: | https://www.mdpi.com/2624-8611/5/3/56 |
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