Charge storage and tunneling mechanism of Ni nanocrystals embedded HfOx film

A nano-floating gate memory structure based on Ni nanocrystals (NCs) embedded HfOx film is deposited by means of radio-frequency magnetron sputtering. Microstructure investigations reveal that self-organized Ni-NCs with diameters of 4-8 nm are well dispersed in amorphous HfOx matrix. Pt/Ni-NCs embed...

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Bibliografiska uppgifter
Huvudupphovsmän: H. X. Zhu, T. Zhang, R. X. Wang, Y. Y. Zhang, L. T. Li, X. Y. Qiu
Materialtyp: Artikel
Språk:English
Publicerad: AIP Publishing LLC 2016-05-01
Serie:AIP Advances
Länkar:http://dx.doi.org/10.1063/1.4948751