Phase and Residual Stress Evaluation of Dual-Phase Al<sub>70</sub>Cr<sub>30</sub>N and Al<sub>80</sub>Cr<sub>20</sub>N PVD Films

We investigated arc ion-plated Al<sub>70</sub>Cr<sub>30</sub>N and Al<sub>80</sub>Cr<sub>20</sub>N thin films deposited with three different bias voltages (50 V, 100 V, and 150 V) to study crystal phase stabilities, residual stresses, and mechanical pr...

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Bibliographic Details
Main Authors: Joern Kohlscheen, Tomohiro Shibata
Format: Article
Language:English
Published: MDPI AG 2019-07-01
Series:Crystals
Subjects:
Online Access:https://www.mdpi.com/2073-4352/9/7/362