A Pragmatic Model to Predict Future Device Aging

A Pragmatic Model to Predict Future Device Aging

To predict long term device aging under use bias, models extracted from voltage accelerated tests must be extrapolated into the future. The traditional model uses a power law, to linearly fit the test data on a log-log plot, and then extrapolates aging kinetics. The challenge is that the measured da...

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Bibliographic Details
Main Authors: James Brown, Kean Hong Tok, Rui Gao, Zhigang Ji, Weidong Zhang, John S. Marsland, Thomas Chiarella, Jacopo Franco, Ben Kaczer, Dimitri Linten, Jian Fu Zhang
Format: Article
Language:English
Published: IEEE 2023-01-01
Series:IEEE Access
Subjects:
Hot carriers
BTI
aging
degradation
lifetime
instability
Online Access:https://ieeexplore.ieee.org/document/10304232/

Internet

https://ieeexplore.ieee.org/document/10304232/

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