Phase Mapping Using a Combination of Multi-Functional Scanning Electron Microscopy Detectors and Imaging Modes

Phase Mapping Using a Combination of Multi-Functional Scanning Electron Microscopy Detectors and Imaging Modes

Microstructure degradation and phase transformations are critical concerns in nickel-based superalloys during thermal exposure. Understanding the phase transformation mechanism requires the detailed mapping of the distribution of each phase at different degradation stages and in various precipitatio...

Ausführliche Beschreibung

Bibliographische Detailangaben
Hauptverfasser:	Gang Liu, Yonghua Zhao, Shuai Wang
Format:	Artikel
Sprache:	English
Veröffentlicht:	MDPI AG 2024-08-01
Schriftenreihe:	Metals
Schlagworte:	nickel-based superalloy phase identification η phase MC-carbide
Online Zugang:	https://www.mdpi.com/2075-4701/14/8/899

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