Emitter-site specificity of hard x-ray photoelectron Kikuchi-diffraction

Emitter-site specificity of hard x-ray photoelectron Kikuchi-diffraction

High-resolution full-field imaging of ( k _x , k _y ) photoelectron distributions ( k -resolution 0.03 Å ^−1 , angular resolution 0.03° at 6.7 keV) in a large field of view (up to 16 Å ^−1 dia.) allows to observe fine details in Kikuchi-type diffractograms. Alongside with the element specificity via...

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Bibliographic Details
Main Authors: O Fedchenko, A Winkelmann, S Chernov, K Medjanik, S Babenkov, S Y Agustsson, D Vasilyev, M Hoesch, H-J Elmers, G Schönhense
Format: Article
Language:English
Published: IOP Publishing 2020-01-01
Series:New Journal of Physics
Subjects:
photoemission
photoelectron diffraction
silicon
interstitial sites
substitutional sites
time-of-flight momentum microscopy
Online Access:https://doi.org/10.1088/1367-2630/abb68b

Internet

https://doi.org/10.1088/1367-2630/abb68b

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