Nano-positive up negative down in binary oxide ferroelectrics

Ferroelectric HfO2 and ZrO2-based materials are promising candidates for next-generation ferroelectric devices, but their characterization is challenging due to complex factors such as crystal phases, degradation mechanisms, and local inhomogeneities. In this work, we propose a novel nanosized posit...

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Bibliographic Details
Main Authors: Andres Gomez, Umberto Celano
Format: Article
Language:English
Published: AIP Publishing LLC 2024-02-01
Series:APL Materials
Online Access:http://dx.doi.org/10.1063/5.0185913