The Software Reliability of Large Scale Integration Circuit and Very Large Scale Integration Circuit
This article describes evaluation method of faultless function of large scale integration circuits (LSI) and very large scale integration circuits (VLSI). In the article there is a comparative analysis of factors which determine faultless of integrated circuits, analysis of already existing methods...
| Main Authors: | , |
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| Format: | Article |
| Language: | English |
| Published: |
VSB-Technical University of Ostrava
2010-01-01
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| Series: | Advances in Electrical and Electronic Engineering |
| Subjects: | |
| Online Access: | http://advances.utc.sk/index.php/AEEE/article/view/27 |