The Software Reliability of Large Scale Integration Circuit and Very Large Scale Integration Circuit

This article describes evaluation method of faultless function of large scale integration circuits (LSI) and very large scale integration circuits (VLSI). In the article there is a comparative analysis of factors which determine faultless of integrated circuits, analysis of already existing methods...

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Main Authors: Artem Ganiyev, Jan Vitasek
Format: Article
Language:English
Published: VSB-Technical University of Ostrava 2010-01-01
Series:Advances in Electrical and Electronic Engineering
Subjects:
Online Access:http://advances.utc.sk/index.php/AEEE/article/view/27
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author Artem Ganiyev
Jan Vitasek
author_facet Artem Ganiyev
Jan Vitasek
author_sort Artem Ganiyev
collection DOAJ
description This article describes evaluation method of faultless function of large scale integration circuits (LSI) and very large scale integration circuits (VLSI). In the article there is a comparative analysis of factors which determine faultless of integrated circuits, analysis of already existing methods and model of faultless function evaluation of LSI and VLSI. The main part describes a proposed algorithm and program for analysis of fault rate in LSI and VLSI circuits.
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spelling doaj.art-c6d80718d00e410ba142bdf089a524172023-05-14T20:50:03ZengVSB-Technical University of OstravaAdvances in Electrical and Electronic Engineering1336-13761804-31192010-01-0182485311The Software Reliability of Large Scale Integration Circuit and Very Large Scale Integration CircuitArtem GaniyevJan VitasekThis article describes evaluation method of faultless function of large scale integration circuits (LSI) and very large scale integration circuits (VLSI). In the article there is a comparative analysis of factors which determine faultless of integrated circuits, analysis of already existing methods and model of faultless function evaluation of LSI and VLSI. The main part describes a proposed algorithm and program for analysis of fault rate in LSI and VLSI circuits.http://advances.utc.sk/index.php/AEEE/article/view/27large scale integration circuitvery large scale integration circuitintegrated circuitmemory componentprogram equipmenttelecommunication system.
spellingShingle Artem Ganiyev
Jan Vitasek
The Software Reliability of Large Scale Integration Circuit and Very Large Scale Integration Circuit
Advances in Electrical and Electronic Engineering
large scale integration circuit
very large scale integration circuit
integrated circuit
memory component
program equipment
telecommunication system.
title The Software Reliability of Large Scale Integration Circuit and Very Large Scale Integration Circuit
title_full The Software Reliability of Large Scale Integration Circuit and Very Large Scale Integration Circuit
title_fullStr The Software Reliability of Large Scale Integration Circuit and Very Large Scale Integration Circuit
title_full_unstemmed The Software Reliability of Large Scale Integration Circuit and Very Large Scale Integration Circuit
title_short The Software Reliability of Large Scale Integration Circuit and Very Large Scale Integration Circuit
title_sort software reliability of large scale integration circuit and very large scale integration circuit
topic large scale integration circuit
very large scale integration circuit
integrated circuit
memory component
program equipment
telecommunication system.
url http://advances.utc.sk/index.php/AEEE/article/view/27
work_keys_str_mv AT artemganiyev thesoftwarereliabilityoflargescaleintegrationcircuitandverylargescaleintegrationcircuit
AT janvitasek thesoftwarereliabilityoflargescaleintegrationcircuitandverylargescaleintegrationcircuit
AT artemganiyev softwarereliabilityoflargescaleintegrationcircuitandverylargescaleintegrationcircuit
AT janvitasek softwarereliabilityoflargescaleintegrationcircuitandverylargescaleintegrationcircuit