A Highly Precise On-State Voltage Measurement Circuit With Dual Current Sources for Online Operation of SiC MOSFETs

A Highly Precise On-State Voltage Measurement Circuit With Dual Current Sources for Online Operation of SiC MOSFETs

This letter proposes an on-state drain-source voltage (<inline-formula><tex-math notation="LaTeX">${V}_{{\rm{ds,on}}}$</tex-math></inline-formula>) measurement circuit for SiC MOSFETs. The proposed circuit effectively solves the problem of inconsistent diode volt-am...

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Bibliographic Details
Main Authors: Hui Meng, Letian Xiang, Luwei Zuo, Fujun Zheng, Ze Zhou, Jianlong Kang, Zhen Xin, Haoze Luo
Format: Article
Language:English
Published: IEEE 2023-01-01
Series:IEEE Open Journal of Power Electronics
Subjects:
Condition monitoring
measurement circuit
on-state voltage
online monitoring
SiC MOSFET
Online Access:https://ieeexplore.ieee.org/document/10195154/

Internet

https://ieeexplore.ieee.org/document/10195154/

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