Polarization-dependent losses in porous silicon ridge waveguides

Porous silicon is a material used in integrated optics with few studies on its structuration impact on the polarization in the near infra-red spectral range. In this letter, we report experimental results from optical characterizations around the wavelength of 1550 nm and for different input polariz...

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Bibliographic Details
Main Authors: F. Cassio, L. Poffo, N. Lorrain, P. Pirasteh, J. Lemaitre, M. Guendouz
Format: Article
Language:English
Published: Elsevier 2022-12-01
Series:Results in Optics
Subjects:
Online Access:http://www.sciencedirect.com/science/article/pii/S2666950122000591