Development and Comparative Analysis of Electrochemically Etched Tungsten Tips for Quartz Tuning Fork Sensor

Development and Comparative Analysis of Electrochemically Etched Tungsten Tips for Quartz Tuning Fork Sensor

Quartz Tuning Fork (QTF) based sensors are used for Scanning Probe Microscopes (SPM), in particular for near-field scanning optical microscopy. Highly sharp Tungsten (W) tips with larger cone angles and less tip diameter are critical for SPM instead of platinum and iridium (Pt/Ir) tips due to their...

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Bibliographic Details
Main Authors: Ashfaq Ali, Naveed Ullah, Asim Ahmad Riaz, Muhammad Zeeshan Zahir, Zuhaib Ali Khan, S. Shaukat Ali Shah, Muftooh Ur Rehman Siddiqi, Muhammad Tahir Hassan
Format: Article
Language:English
Published: MDPI AG 2021-03-01
Series:Micromachines
Subjects:
scanning probe microscopy
tungsten tips
electrochemical etching
scanning electron microscope
quartz tuning fork sensor
Online Access:https://www.mdpi.com/2072-666X/12/3/286

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https://www.mdpi.com/2072-666X/12/3/286

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