Anomaly Detection Using Siamese Network with Attention Mechanism for Few-Shot Learning

Automated inspection using deep-learning has been attracting attention for visual inspection at the manufacturing site. However, the inability to obtain sufficient abnormal product data for training deep- learning models is a problem in practical application. This study proposes an anomaly detection...

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Bibliographic Details
Main Authors: Hironori Takimoto, Junya Seki, Sulfayanti F. Situju, Akihiro Kanagawa
Format: Article
Language:English
Published: Taylor & Francis Group 2022-12-01
Series:Applied Artificial Intelligence
Online Access:http://dx.doi.org/10.1080/08839514.2022.2094885