Deep Transfer Learning-Based Fault Diagnosis Using Wavelet Transform for Limited Data

Deep Transfer Learning-Based Fault Diagnosis Using Wavelet Transform for Limited Data

Although various deep learning techniques have been proposed to diagnose industrial faults, it is still challenging to obtain sufficient training samples to build the fault diagnosis model in practice. This paper presents a framework that combines wavelet transformation and transfer learning (TL) fo...

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Bibliographic Details
Main Authors: Junseong Bang, Piergiuseppe Di Marco, Hyejeon Shin, Pangun Park
Format: Article
Language:English
Published: MDPI AG 2022-07-01
Series:Applied Sciences
Subjects:
transfer learning
wavelet
limited data
fault detection
fault diagnosis
machinery fault
Online Access:https://www.mdpi.com/2076-3417/12/15/7450

Internet

https://www.mdpi.com/2076-3417/12/15/7450

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