Deep Transfer Learning-Based Fault Diagnosis Using Wavelet Transform for Limited Data

Although various deep learning techniques have been proposed to diagnose industrial faults, it is still challenging to obtain sufficient training samples to build the fault diagnosis model in practice. This paper presents a framework that combines wavelet transformation and transfer learning (TL) fo...

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Bibliographic Details
Main Authors: Junseong Bang, Piergiuseppe Di Marco, Hyejeon Shin, Pangun Park
Format: Article
Language:English
Published: MDPI AG 2022-07-01
Series:Applied Sciences
Subjects:
Online Access:https://www.mdpi.com/2076-3417/12/15/7450
Description
Summary:Although various deep learning techniques have been proposed to diagnose industrial faults, it is still challenging to obtain sufficient training samples to build the fault diagnosis model in practice. This paper presents a framework that combines wavelet transformation and transfer learning (TL) for fault diagnosis with limited target samples. The wavelet transform converts a time-series sample to a time-frequency representative image based on the extracted hidden time and frequency features of various faults. On the other hand, the TL technique leverages the existing neural networks, called GoogLeNet, which were trained using a sufficient source data set for different target tasks. Since the data distributions between the source and the target domains are considerably different in industrial practice, we partially retrain the pre-trained model of the source domain using intermediate samples that are conceptually related to the target domain. We use a reciprocating pump model to generate various combinations of faults with different severity levels and evaluate the effectiveness of the proposed method. The results show that the proposed method provides higher diagnostic accuracy than the support vector machine and the convolutional neural network under wide variations in the training data size and the fault severity. In particular, we show that the severity level of the fault condition heavily affects the diagnostic performance.
ISSN:2076-3417