Photoconductive NSOM for mapping optoelectronic phases in nanostructures

Photoconductive NSOM for mapping optoelectronic phases in nanostructures

The advent of optically functional materials with low-intensive processing methods is accompanied by a growing need for high resolution imaging to probe the inherent inhomogeneities in the underlying microstructure. Atomic force microscopy based techniques are typically utilized for imaging the surf...

Bibliografski detalji
Glavni autori:	Das Anshuman J., Shivanna Ravichandran, Narayan K.S.
Format:	Članak
Jezik:	English
Izdano:	De Gruyter 2014-04-01
Serija:	Nanophotonics
Teme:	microscopy near field scanning nanomorphology
Online pristup:	https://doi.org/10.1515/nanoph-2013-0043

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