Photoconductive NSOM for mapping optoelectronic phases in nanostructures
The advent of optically functional materials with low-intensive processing methods is accompanied by a growing need for high resolution imaging to probe the inherent inhomogeneities in the underlying microstructure. Atomic force microscopy based techniques are typically utilized for imaging the surf...
| Egile Nagusiak: | , , |
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| Formatua: | Artikulua |
| Hizkuntza: | English |
| Argitaratua: |
De Gruyter
2014-04-01
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| Saila: | Nanophotonics |
| Gaiak: | |
| Sarrera elektronikoa: | https://doi.org/10.1515/nanoph-2013-0043 |