A New Experimental Method for Determining the Thickness of Thin Surface Layers of Intensive Plastic Deformation Using Electron Backscatter Diffraction Data

A New Experimental Method for Determining the Thickness of Thin Surface Layers of Intensive Plastic Deformation Using Electron Backscatter Diffraction Data

It is, in general, essential to investigate correlations between the microstructure and properties of materials. Plastic deformation often localizes within thin layers. As a result, many material properties within such layers are very different from the properties in bulk. The present paper proposes...

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Bibliographic Details
Main Authors: Alexander Smirnov, Evgeniya Smirnova, Sergey Alexandrov
Format: Article
Language:English
Published: MDPI AG 2020-04-01
Series:Symmetry
Subjects:
electron backscatter diffraction (EBSD)
microindentation
kernel average misorientation
kernel-based algorithm
grain-based algorithm
surface layer
Online Access:https://www.mdpi.com/2073-8994/12/4/677

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https://www.mdpi.com/2073-8994/12/4/677

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