Local V OC Measurements by Kelvin Probe Force Microscopy Applied on P-I-N Radial Junction Si Nanowires

Local V OC Measurements by Kelvin Probe Force Microscopy Applied on P-I-N Radial Junction Si Nanowires

Abstract This work focuses on the extraction of the open circuit voltage (V OC) on photovoltaic nanowires by surface photovoltage (SPV) based on Kelvin probe force microscopy (KPFM) measurements. In a first approach, P-I-N radial junction (RJ) silicon nanowire (SiNW) devices were investigated under...

Full description

Bibliographic Details
Main Authors: Clément Marchat, Letian Dai, José Alvarez, Sylvain Le Gall, Jean-Paul Kleider, Soumyadeep Misra, Pere Roca i Cabarrocas
Format: Article
Language:English
Published: SpringerOpen 2019-12-01
Series:Nanoscale Research Letters
Subjects:
Solar cells
KP
Nanoscale
Characterization
Surface photovoltage spectroscopy
SPS
Online Access:https://doi.org/10.1186/s11671-019-3230-5

Internet

https://doi.org/10.1186/s11671-019-3230-5

Similar Items