Methods for Analyzing Avionics Reliability Reflecting Atmospheric Radiation in the Preliminary Development Phase: An Integrated Failure Rate Analysis
Advances in deep submicron semiconductor technology have increased the significance of studying soft errors caused by atmospheric radiation in avionics systems. Atmospheric radiation particles, such as protons and neutrons, can induce Single Event Upsets (SEUs) in sensitive electronic components, le...
| Հիմնական հեղինակներ: | , |
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| Ձևաչափ: | Հոդված |
| Լեզու: | English |
| Հրապարակվել է: |
MDPI AG
2025-02-01
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| Շարք: | Aerospace |
| Խորագրեր: | |
| Առցանց հասանելիություն: | https://www.mdpi.com/2226-4310/12/2/118 |