Effects of interfacial potential smoothness on reflectivity, phase, and polarization of reflected neutrons from magnetic films in neutron reflectometry
In the past decades, neutron reflectometry have flourished as an applicable method to the study of thin films. As an example, the type and thickness of an unknown thin film which is mounted on top of a magnetic substratum could be determined by measuring the intensity and polarization of the reflect...
| Main Authors: | , |
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| Format: | Article |
| Language: | English |
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Isfahan University of Technology
2010-03-01
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| Series: | Iranian Journal of Physics Research |
| Subjects: | |
| Online Access: | http://ijpr.iut.ac.ir/browse.php?a_code=A-10-1-438&slc_lang=en&sid=1 |