X-ray free-electron laser induced acoustic microscopy (XFELAM)

X-ray free-electron laser induced acoustic microscopy (XFELAM)

The X-ray free-electron laser (XFEL) has remarkably advanced X-ray imaging technology and enabled important scientific achievements. The XFEL’s extremely high power, short pulse width, low emittance, and high coherence make possible such diverse imaging techniques as absorption/emission spectroscopy...

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Bibliographic Details
Main Authors: Seongwook Choi, Sinyoung Park, Jiwoong Kim, Hyunhee Kim, Seonghee Cho, Sunam Kim, Jaeku Park, Chulhong Kim
Format: Article
Language:English
Published: Elsevier 2024-02-01
Series:Photoacoustics
Subjects:
XFEL
X-ray-induced acoustic
Photoacoustic
X-ray
Accelerator
Synchrotron
Online Access:http://www.sciencedirect.com/science/article/pii/S2213597924000041

Internet

http://www.sciencedirect.com/science/article/pii/S2213597924000041

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