Thickness-dependent optimization of Er<sup>3+ </sup>light emission from silicon-rich silicon oxide thin films

Thickness-dependent optimization of Er<sup>3+ </sup>light emission from silicon-rich silicon oxide thin films

<p>Abstract</p> <p>This study investigates the influence of the film thickness on the silicon-excess-mediated sensitization of Erbium ions in Si-rich silica. The Er<sup>3+ </sup>photoluminescence at 1.5 &#956;m, normalized to the film thickness, was found five times...

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Bibliographic Details
Main Authors: Jambois Olivier, Garrido Blas, Cueff S&#233;bastien, Labb&#233; Christophe, Portier Xavier, Rizk Richard
Format: Article
Language:English
Published: SpringerOpen 2011-01-01
Series:Nanoscale Research Letters
Online Access:http://www.nanoscalereslett.com/content/6/1/395

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http://www.nanoscalereslett.com/content/6/1/395

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