Ultrafast lattice response of photoexcited thin films studied by X-ray diffraction

Ultrafast lattice response of photoexcited thin films studied by X-ray diffraction

Using ultrafast X-ray diffraction, we study the coherent picosecond lattice dynamics of photoexcited thin films in the two limiting cases, where the photoinduced stress profile decays on a length scale larger and smaller than the film thickness. We solve a unifying analytical model of the strain pro...

Volledige beschrijving

Bibliografische gegevens
Hoofdauteurs: Daniel Schick, Marc Herzog, André Bojahr, Wolfram Leitenberger, Andreas Hertwig, Roman Shayduk, Matias Bargheer
Formaat: Artikel
Taal:English
Gepubliceerd in: AIP Publishing LLC and ACA 2014-11-01
Reeks:Structural Dynamics
Online toegang:http://dx.doi.org/10.1063/1.4901228

Internet

http://dx.doi.org/10.1063/1.4901228

Gelijkaardige items