Ultrafast lattice response of photoexcited thin films studied by X-ray diffraction
Using ultrafast X-ray diffraction, we study the coherent picosecond lattice dynamics of photoexcited thin films in the two limiting cases, where the photoinduced stress profile decays on a length scale larger and smaller than the film thickness. We solve a unifying analytical model of the strain pro...
| Main Authors: | , , , , , , |
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| Formato: | Artigo |
| Idioma: | English |
| Publicado em: |
AIP Publishing LLC and ACA
2014-11-01
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| Colecção: | Structural Dynamics |
| Acesso em linha: | http://dx.doi.org/10.1063/1.4901228 |