Analysis of HBM Failure in 3D NAND Flash Memory

Analysis of HBM Failure in 3D NAND Flash Memory

Electrostatic discharge (ESD) events are the main factors impacting the reliability of NAND Flash memory. The behavior of human body model (HBM) failure and the corresponding physical mechanism of 3D NAND Flash memory are investigated in this paper. A catastrophic burn-out failure during HBM zapping...

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Bibliographic Details
Main Authors: Biruo Song, Zhiguo Li, Xin Wang, Xiang Fu, Fei Liu, Lei Jin, Zongliang Huo
Format: Article
Language:English
Published: MDPI AG 2022-03-01
Series:Electronics
Subjects:
electrostatic discharge (ESD)
human body model (HBM)
transmission line pulse (TLP)
technology computer aided design (TCAD)
3D NAND Flash memory
Online Access:https://www.mdpi.com/2079-9292/11/6/944

Internet

https://www.mdpi.com/2079-9292/11/6/944

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