Secure Exchange of Digital Metrological Data in a Smart Overhead Crane

Digitalization and the rapid development of IoT systems has posed challenges for metrology because it has been comparatively slow in adapting to the new demands. That is why the digital transformation of metrology has become a key research and development topic all over the world including the devel...

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Bibliographic Details
Main Authors: Tuukka Mustapää, Henri Tunkkari, Jaan Taponen, Leo Immonen, Wiebke Heeren, Oksana Baer, Clifford Brown, Raine Viitala
Format: Article
Language:English
Published: MDPI AG 2022-02-01
Series:Sensors
Subjects:
Online Access:https://www.mdpi.com/1424-8220/22/4/1548