ROUGHNESS STUDY OF PAPER MADE FROM SECONDARY RAW MATERIALS BY ATOMIC FORCE MICROSCOPY
The paper considers the issues of high-precision parameter control of the produced paper products with secondary raw materials as a component. A method of atomic force microscopy is proposed for paper roughness study. Visualization of the obtained topographic images of each type of paper surface und...
Main Authors: | , , , |
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Format: | Article |
Language: | English |
Published: |
Saint Petersburg National Research University of Information Technologies, Mechanics and Optics (ITMO University)
2020-10-01
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Series: | Naučno-tehničeskij Vestnik Informacionnyh Tehnologij, Mehaniki i Optiki |
Subjects: | |
Online Access: | https://ntv.ifmo.ru/file/article/19934.pdf |