Sequentially evaporated layer deposition stack of CuxS thin films for photonics applications
CuxS(x;1,2) layers were grown on thermal annealing of the sequentially evaporated layer deposition (SELD) stack of Cu/S from 373 to 573 K. The thicknesses of the deposited stacks were fixed at 200 and 600 nm. The 300 K deposited layers possess a CuS (covellite) phase and a few impurity peaks of Sulp...
| Main Authors: | , , , |
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| Format: | Article |
| Language: | English |
| Published: |
Elsevier
2022-09-01
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| Series: | Journal of Materials Research and Technology |
| Subjects: | |
| Online Access: | http://www.sciencedirect.com/science/article/pii/S2238785422013308 |