Application of Factorisation Methods to Analysis of Elemental Distribution Maps Acquired with a Full-Field XRF Imaging Spectrometer

Application of Factorisation Methods to Analysis of Elemental Distribution Maps Acquired with a Full-Field XRF Imaging Spectrometer

The goal of the work was to investigate the possible application of factor analysis methods for processing X-ray Fluorescence (XRF) data acquired with a full-field XRF spectrometer employing a position-sensitive and energy-dispersive Gas Electron Multiplier (GEM) detector, which provides only limite...

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Bibliographic Details
Main Authors: Bartłomiej Łach, Tomasz Fiutowski, Stefan Koperny, Paulina Krupska-Wolas, Marek Lankosz, Agata Mendys-Frodyma, Bartosz Mindur, Krzysztof Świentek, Piotr Wiącek, Paweł M. Wróbel, Władysław Dąbrowski
Format: Article
Language:English
Published: MDPI AG 2021-11-01
Series:Sensors
Subjects:
XRF spectral imaging
image processing
micropattern gaseous detectors
Online Access:https://www.mdpi.com/1424-8220/21/23/7965

Internet

https://www.mdpi.com/1424-8220/21/23/7965

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