Application of Factorisation Methods to Analysis of Elemental Distribution Maps Acquired with a Full-Field XRF Imaging Spectrometer
The goal of the work was to investigate the possible application of factor analysis methods for processing X-ray Fluorescence (XRF) data acquired with a full-field XRF spectrometer employing a position-sensitive and energy-dispersive Gas Electron Multiplier (GEM) detector, which provides only limite...
| Main Authors: | , , , , , , , , , , |
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| Format: | Article |
| Language: | English |
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MDPI AG
2021-11-01
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| Series: | Sensors |
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| Online Access: | https://www.mdpi.com/1424-8220/21/23/7965 |
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| author | Bartłomiej Łach Tomasz Fiutowski Stefan Koperny Paulina Krupska-Wolas Marek Lankosz Agata Mendys-Frodyma Bartosz Mindur Krzysztof Świentek Piotr Wiącek Paweł M. Wróbel Władysław Dąbrowski |
| author_facet | Bartłomiej Łach Tomasz Fiutowski Stefan Koperny Paulina Krupska-Wolas Marek Lankosz Agata Mendys-Frodyma Bartosz Mindur Krzysztof Świentek Piotr Wiącek Paweł M. Wróbel Władysław Dąbrowski |
| author_sort | Bartłomiej Łach |
| collection | DOAJ |
| description | The goal of the work was to investigate the possible application of factor analysis methods for processing X-ray Fluorescence (XRF) data acquired with a full-field XRF spectrometer employing a position-sensitive and energy-dispersive Gas Electron Multiplier (GEM) detector, which provides only limited energy resolution at a level of 18% Full Width at Half Maximum (FWHM) at 5.9 keV. In this article, we present the design and performance of the full-field imaging spectrometer and the results of case studies performed using the developed instrument. The XRF imaging data collected for two historical paintings are presented along with the procedures applied to data calibration and analysis. The maps of elemental distributions were built using three different analysis methods: Region of Interest (ROI), Non-Negative Matrix Factorisation (NMF), and Principal Component Analysis (PCA). The results obtained for these paintings show that the factor analysis methods NMF and PCA provide significant enhancement of selectivity of the elemental analysis in case of limited energy resolution of the spectrometer. |
| first_indexed | 2024-03-10T04:45:50Z |
| format | Article |
| id | doaj.art-cda5f2ee312d412fb774310c0ede1fc2 |
| institution | Directory Open Access Journal |
| issn | 1424-8220 |
| language | English |
| last_indexed | 2024-03-10T04:45:50Z |
| publishDate | 2021-11-01 |
| publisher | MDPI AG |
| record_format | Article |
| series | Sensors |
| spelling | doaj.art-cda5f2ee312d412fb774310c0ede1fc22023-11-23T03:01:52ZengMDPI AGSensors1424-82202021-11-012123796510.3390/s21237965Application of Factorisation Methods to Analysis of Elemental Distribution Maps Acquired with a Full-Field XRF Imaging SpectrometerBartłomiej Łach0Tomasz Fiutowski1Stefan Koperny2Paulina Krupska-Wolas3Marek Lankosz4Agata Mendys-Frodyma5Bartosz Mindur6Krzysztof Świentek7Piotr Wiącek8Paweł M. Wróbel9Władysław Dąbrowski10Faculty of Physics and Applied Computer Science, AGH University of Science and Technology, al. Mickiewicza 30, 30-059 Kraków, PolandFaculty of Physics and Applied Computer Science, AGH University of Science and Technology, al. Mickiewicza 30, 30-059 Kraków, PolandFaculty of Physics and Applied Computer Science, AGH University of Science and Technology, al. Mickiewicza 30, 30-059 Kraków, PolandLaboratory of Analysis and Non-Destructive Investigation of Heritage Objects, The National Museum in Krakow, al. 3 Maja 1, 30-062 Kraków, PolandFaculty of Physics and Applied Computer Science, AGH University of Science and Technology, al. Mickiewicza 30, 30-059 Kraków, PolandLaboratory of Analysis and Non-Destructive Investigation of Heritage Objects, The National Museum in Krakow, al. 3 Maja 1, 30-062 Kraków, PolandFaculty of Physics and Applied Computer Science, AGH University of Science and Technology, al. Mickiewicza 30, 30-059 Kraków, PolandFaculty of Physics and Applied Computer Science, AGH University of Science and Technology, al. Mickiewicza 30, 30-059 Kraków, PolandFaculty of Physics and Applied Computer Science, AGH University of Science and Technology, al. Mickiewicza 30, 30-059 Kraków, PolandFaculty of Physics and Applied Computer Science, AGH University of Science and Technology, al. Mickiewicza 30, 30-059 Kraków, PolandFaculty of Physics and Applied Computer Science, AGH University of Science and Technology, al. Mickiewicza 30, 30-059 Kraków, PolandThe goal of the work was to investigate the possible application of factor analysis methods for processing X-ray Fluorescence (XRF) data acquired with a full-field XRF spectrometer employing a position-sensitive and energy-dispersive Gas Electron Multiplier (GEM) detector, which provides only limited energy resolution at a level of 18% Full Width at Half Maximum (FWHM) at 5.9 keV. In this article, we present the design and performance of the full-field imaging spectrometer and the results of case studies performed using the developed instrument. The XRF imaging data collected for two historical paintings are presented along with the procedures applied to data calibration and analysis. The maps of elemental distributions were built using three different analysis methods: Region of Interest (ROI), Non-Negative Matrix Factorisation (NMF), and Principal Component Analysis (PCA). The results obtained for these paintings show that the factor analysis methods NMF and PCA provide significant enhancement of selectivity of the elemental analysis in case of limited energy resolution of the spectrometer.https://www.mdpi.com/1424-8220/21/23/7965XRF spectral imagingimage processingmicropattern gaseous detectors |
| spellingShingle | Bartłomiej Łach Tomasz Fiutowski Stefan Koperny Paulina Krupska-Wolas Marek Lankosz Agata Mendys-Frodyma Bartosz Mindur Krzysztof Świentek Piotr Wiącek Paweł M. Wróbel Władysław Dąbrowski Application of Factorisation Methods to Analysis of Elemental Distribution Maps Acquired with a Full-Field XRF Imaging Spectrometer Sensors XRF spectral imaging image processing micropattern gaseous detectors |
| title | Application of Factorisation Methods to Analysis of Elemental Distribution Maps Acquired with a Full-Field XRF Imaging Spectrometer |
| title_full | Application of Factorisation Methods to Analysis of Elemental Distribution Maps Acquired with a Full-Field XRF Imaging Spectrometer |
| title_fullStr | Application of Factorisation Methods to Analysis of Elemental Distribution Maps Acquired with a Full-Field XRF Imaging Spectrometer |
| title_full_unstemmed | Application of Factorisation Methods to Analysis of Elemental Distribution Maps Acquired with a Full-Field XRF Imaging Spectrometer |
| title_short | Application of Factorisation Methods to Analysis of Elemental Distribution Maps Acquired with a Full-Field XRF Imaging Spectrometer |
| title_sort | application of factorisation methods to analysis of elemental distribution maps acquired with a full field xrf imaging spectrometer |
| topic | XRF spectral imaging image processing micropattern gaseous detectors |
| url | https://www.mdpi.com/1424-8220/21/23/7965 |
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