A phenomenological model of the X-ray pulse statistics of a high-repetition-rate X-ray free-electron laser

Many coherent imaging applications that utilize ultrafast X-ray free-electron laser (XFEL) radiation pulses are highly sensitive to fluctuations in the shot-to-shot statistical properties of the source. Understanding and modelling these fluctuations are key to successful experiment planning and nece...

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Bibliographic Details
Main Authors: Trey W. Guest, Richard Bean, Raimund Kammering, Grant van Riessen, Adrian P. Mancuso, Brian Abbey
Format: Article
Language:English
Published: International Union of Crystallography 2023-11-01
Series:IUCrJ
Subjects:
Online Access:http://scripts.iucr.org/cgi-bin/paper?S2052252523008242