A phenomenological model of the X-ray pulse statistics of a high-repetition-rate X-ray free-electron laser
Many coherent imaging applications that utilize ultrafast X-ray free-electron laser (XFEL) radiation pulses are highly sensitive to fluctuations in the shot-to-shot statistical properties of the source. Understanding and modelling these fluctuations are key to successful experiment planning and nece...
Main Authors: | , , , , , |
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Format: | Article |
Language: | English |
Published: |
International Union of Crystallography
2023-11-01
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Series: | IUCrJ |
Subjects: | |
Online Access: | http://scripts.iucr.org/cgi-bin/paper?S2052252523008242 |