A phenomenological model of the X-ray pulse statistics of a high-repetition-rate X-ray free-electron laser
Many coherent imaging applications that utilize ultrafast X-ray free-electron laser (XFEL) radiation pulses are highly sensitive to fluctuations in the shot-to-shot statistical properties of the source. Understanding and modelling these fluctuations are key to successful experiment planning and nece...
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International Union of Crystallography
2023-11-01
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Online Access: | http://scripts.iucr.org/cgi-bin/paper?S2052252523008242 |
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author | Trey W. Guest Richard Bean Raimund Kammering Grant van Riessen Adrian P. Mancuso Brian Abbey |
author_facet | Trey W. Guest Richard Bean Raimund Kammering Grant van Riessen Adrian P. Mancuso Brian Abbey |
author_sort | Trey W. Guest |
collection | DOAJ |
description | Many coherent imaging applications that utilize ultrafast X-ray free-electron laser (XFEL) radiation pulses are highly sensitive to fluctuations in the shot-to-shot statistical properties of the source. Understanding and modelling these fluctuations are key to successful experiment planning and necessary to maximize the potential of XFEL facilities. Current models of XFEL radiation and their shot-to-shot statistics are based on theoretical descriptions of the source and are limited in their ability to capture the shot-to-shot intensity fluctuations observed experimentally. The lack of accurate temporal statistics in simulations that utilize these models is a significant barrier to optimizing and interpreting data from XFEL coherent diffraction experiments. Presented here is a phenomenological model of XFEL radiation that is capable of capturing the shot-to-shot statistics observed experimentally using a simple time-dependent approximation of the pulse wavefront. The model is applied to reproduce non-stationary shot-to-shot intensity fluctuations observed at the European XFEL, whilst accurately representing the single-shot properties predicted by FEL theory. Compared with previous models, this approach provides a simple, robust and computationally inexpensive method of generating statistical representations of XFEL radiation. |
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language | English |
last_indexed | 2024-03-11T13:44:38Z |
publishDate | 2023-11-01 |
publisher | International Union of Crystallography |
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spelling | doaj.art-cdb13332e80348208a8cddd24858c2ff2023-11-02T10:54:51ZengInternational Union of CrystallographyIUCrJ2052-25252023-11-0110670871910.1107/S2052252523008242if5002A phenomenological model of the X-ray pulse statistics of a high-repetition-rate X-ray free-electron laserTrey W. Guest0Richard Bean1Raimund Kammering2Grant van Riessen3Adrian P. Mancuso4Brian Abbey5La Trobe Institute for Molecular Science, La Trobe University, Bundoora, VIC 3086, AustraliaEuropean XFEL, Holzkoppel 4, 22869 Schenefeld, GermanyDeutsches Elektronen-Synchrotron, Notkestraße 85, 22607 Hamburg, GermanyLa Trobe Institute for Molecular Science, La Trobe University, Bundoora, VIC 3086, AustraliaLa Trobe Institute for Molecular Science, La Trobe University, Bundoora, VIC 3086, AustraliaLa Trobe Institute for Molecular Science, La Trobe University, Bundoora, VIC 3086, AustraliaMany coherent imaging applications that utilize ultrafast X-ray free-electron laser (XFEL) radiation pulses are highly sensitive to fluctuations in the shot-to-shot statistical properties of the source. Understanding and modelling these fluctuations are key to successful experiment planning and necessary to maximize the potential of XFEL facilities. Current models of XFEL radiation and their shot-to-shot statistics are based on theoretical descriptions of the source and are limited in their ability to capture the shot-to-shot intensity fluctuations observed experimentally. The lack of accurate temporal statistics in simulations that utilize these models is a significant barrier to optimizing and interpreting data from XFEL coherent diffraction experiments. Presented here is a phenomenological model of XFEL radiation that is capable of capturing the shot-to-shot statistics observed experimentally using a simple time-dependent approximation of the pulse wavefront. The model is applied to reproduce non-stationary shot-to-shot intensity fluctuations observed at the European XFEL, whilst accurately representing the single-shot properties predicted by FEL theory. Compared with previous models, this approach provides a simple, robust and computationally inexpensive method of generating statistical representations of XFEL radiation.http://scripts.iucr.org/cgi-bin/paper?S2052252523008242x-ray free-electron lasersxfelscorrelated fluctuationstime-resolved studiescomputational modellingdynamic simulationsmhz xfelswavefront propagationtemporal coherence |
spellingShingle | Trey W. Guest Richard Bean Raimund Kammering Grant van Riessen Adrian P. Mancuso Brian Abbey A phenomenological model of the X-ray pulse statistics of a high-repetition-rate X-ray free-electron laser IUCrJ x-ray free-electron lasers xfels correlated fluctuations time-resolved studies computational modelling dynamic simulations mhz xfels wavefront propagation temporal coherence |
title | A phenomenological model of the X-ray pulse statistics of a high-repetition-rate X-ray free-electron laser |
title_full | A phenomenological model of the X-ray pulse statistics of a high-repetition-rate X-ray free-electron laser |
title_fullStr | A phenomenological model of the X-ray pulse statistics of a high-repetition-rate X-ray free-electron laser |
title_full_unstemmed | A phenomenological model of the X-ray pulse statistics of a high-repetition-rate X-ray free-electron laser |
title_short | A phenomenological model of the X-ray pulse statistics of a high-repetition-rate X-ray free-electron laser |
title_sort | phenomenological model of the x ray pulse statistics of a high repetition rate x ray free electron laser |
topic | x-ray free-electron lasers xfels correlated fluctuations time-resolved studies computational modelling dynamic simulations mhz xfels wavefront propagation temporal coherence |
url | http://scripts.iucr.org/cgi-bin/paper?S2052252523008242 |
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