Probing the Intrinsic Strain in Suspended Graphene Films Using Electron and Optical Microscopy

Probing the Intrinsic Strain in Suspended Graphene Films Using Electron and Optical Microscopy

Abstract Quantifying the intrinsic properties of 2D materials is of paramount importance for advancing their applications. Large‐scale production of 2D materials merits the need for approaches that provide direct information about the role of growth substrate on 2D material properties. Transferring...

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Bibliographic Details
Main Authors: Kishan Thodkar, Milivoj Plodinec, Fabian Gramm, Karsten Kunze
Format: Article
Language:English
Published: Wiley 2024-02-01
Series:Advanced Science
Subjects:
chemical vapor deposition (CVD)
electron backscatter diffraction (EBSD)
Raman spectroscopy
suspended graphene
transmission electron microscopy (TEM)
Online Access:https://doi.org/10.1002/advs.202305366

Internet

https://doi.org/10.1002/advs.202305366

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