Built-In Functional Testing of Analog In-Memory Accelerators for Deep Neural Networks

Built-In Functional Testing of Analog In-Memory Accelerators for Deep Neural Networks

The paper develops a methodology for the online built-in self-testing of deep neural network (DNN) accelerators to validate the correct operation with respect to their functional specifications. The DNN of interest is realized in the hardware to perform in-memory computing using non-volatile memory...

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Bibliographic Details
Main Authors: Abhishek Kumar Mishra , Anup Kumar Das, Nagarajan Kandasamy
Format: Article
Language:English
Published: MDPI AG 2022-08-01
Series:Electronics
Subjects:
functional testing
pseudorandom testing
in-memory computing
deep neural networks
non-volatile memory
Online Access:https://www.mdpi.com/2079-9292/11/16/2592

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https://www.mdpi.com/2079-9292/11/16/2592

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