Upgraded Combined Inject-and-Transfer System for Serial Femtosecond Crystallography

Upgraded Combined Inject-and-Transfer System for Serial Femtosecond Crystallography

Serial femtosecond crystallography (SFX) using an X-ray free-electron laser (XFEL) can be applied to determine the room-temperature structure of target molecules while minimizing radiation damage and visualizing molecular dynamics. In SFX, a sample delivery system is required to deliver microcrystal...

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Bibliographic Details
Main Authors: Keondo Lee, Donghyeon Lee, Jaehyun Park, Jong-Lam Lee, Wan Kyun Chung, Yunje Cho, Ki Hyun Nam
Format: Article
Language:English
Published: MDPI AG 2022-09-01
Series:Applied Sciences
Subjects:
serial femtosecond crystallography
X-ray free-electron laser
BITS
sample chamber
fixed-target
injection
Online Access:https://www.mdpi.com/2076-3417/12/18/9125

Internet

https://www.mdpi.com/2076-3417/12/18/9125

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