Upgraded Combined Inject-and-Transfer System for Serial Femtosecond Crystallography
Serial femtosecond crystallography (SFX) using an X-ray free-electron laser (XFEL) can be applied to determine the room-temperature structure of target molecules while minimizing radiation damage and visualizing molecular dynamics. In SFX, a sample delivery system is required to deliver microcrystal...
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MDPI AG
2022-09-01
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Online Access: | https://www.mdpi.com/2076-3417/12/18/9125 |
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author | Keondo Lee Donghyeon Lee Jaehyun Park Jong-Lam Lee Wan Kyun Chung Yunje Cho Ki Hyun Nam |
author_facet | Keondo Lee Donghyeon Lee Jaehyun Park Jong-Lam Lee Wan Kyun Chung Yunje Cho Ki Hyun Nam |
author_sort | Keondo Lee |
collection | DOAJ |
description | Serial femtosecond crystallography (SFX) using an X-ray free-electron laser (XFEL) can be applied to determine the room-temperature structure of target molecules while minimizing radiation damage and visualizing molecular dynamics. In SFX, a sample delivery system is required to deliver microcrystals to the XFEL beam path in a serial manner. We recently developed a sample delivery method, the combined inject-and-transfer system (BITS), which is a hybrid method based on the injector and fixed-target scanning approach. In this study, we introduced recently upgraded hardware to move the injection needle in the direction of the <i>XYZ</i>-axis and a graphic user interface for user motion control. Furthermore, we report that the viscous solution containing 10% (<i>w</i>/<i>v</i>) PEG 3350 or PEG 6000 that is widely used for protein crystallization can be stably deposited on polyimide film with a hydrophobic surface without any special treatment. Moreover, the development of an inject-and-diffuse method for time-resolved studies with liquid applications in the BITS and its preliminary results are reported. This study provides up-to-date instrument information to SFX users using BITS and provides insights to instrument developers for SFX. |
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issn | 2076-3417 |
language | English |
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spelling | doaj.art-cdfadfb9f2a54e03af095f1c905976bf2023-11-23T14:53:26ZengMDPI AGApplied Sciences2076-34172022-09-011218912510.3390/app12189125Upgraded Combined Inject-and-Transfer System for Serial Femtosecond CrystallographyKeondo Lee0Donghyeon Lee1Jaehyun Park2Jong-Lam Lee3Wan Kyun Chung4Yunje Cho5Ki Hyun Nam6Department of Mechanical Engineering, Pohang University of Science and Technology, Pohang 37673, KoreaDepartment of Mechanical Engineering, Pohang University of Science and Technology, Pohang 37673, KoreaPohang Accelerator Laboratory, Pohang University of Science and Technology, Pohang 37673, KoreaDepartment of Materials Science and Engineering, Pohang University of Science and Technology, Pohang 37673, KoreaDepartment of Mechanical Engineering, Pohang University of Science and Technology, Pohang 37673, KoreaDepartment of Life Science, Pohang University of Science and Technology, Pohang 37673, KoreaDepartment of Life Science, Pohang University of Science and Technology, Pohang 37673, KoreaSerial femtosecond crystallography (SFX) using an X-ray free-electron laser (XFEL) can be applied to determine the room-temperature structure of target molecules while minimizing radiation damage and visualizing molecular dynamics. In SFX, a sample delivery system is required to deliver microcrystals to the XFEL beam path in a serial manner. We recently developed a sample delivery method, the combined inject-and-transfer system (BITS), which is a hybrid method based on the injector and fixed-target scanning approach. In this study, we introduced recently upgraded hardware to move the injection needle in the direction of the <i>XYZ</i>-axis and a graphic user interface for user motion control. Furthermore, we report that the viscous solution containing 10% (<i>w</i>/<i>v</i>) PEG 3350 or PEG 6000 that is widely used for protein crystallization can be stably deposited on polyimide film with a hydrophobic surface without any special treatment. Moreover, the development of an inject-and-diffuse method for time-resolved studies with liquid applications in the BITS and its preliminary results are reported. This study provides up-to-date instrument information to SFX users using BITS and provides insights to instrument developers for SFX.https://www.mdpi.com/2076-3417/12/18/9125serial femtosecond crystallographyX-ray free-electron laserBITSsample chamberfixed-targetinjection |
spellingShingle | Keondo Lee Donghyeon Lee Jaehyun Park Jong-Lam Lee Wan Kyun Chung Yunje Cho Ki Hyun Nam Upgraded Combined Inject-and-Transfer System for Serial Femtosecond Crystallography Applied Sciences serial femtosecond crystallography X-ray free-electron laser BITS sample chamber fixed-target injection |
title | Upgraded Combined Inject-and-Transfer System for Serial Femtosecond Crystallography |
title_full | Upgraded Combined Inject-and-Transfer System for Serial Femtosecond Crystallography |
title_fullStr | Upgraded Combined Inject-and-Transfer System for Serial Femtosecond Crystallography |
title_full_unstemmed | Upgraded Combined Inject-and-Transfer System for Serial Femtosecond Crystallography |
title_short | Upgraded Combined Inject-and-Transfer System for Serial Femtosecond Crystallography |
title_sort | upgraded combined inject and transfer system for serial femtosecond crystallography |
topic | serial femtosecond crystallography X-ray free-electron laser BITS sample chamber fixed-target injection |
url | https://www.mdpi.com/2076-3417/12/18/9125 |
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