Universal transfer of full‐class metal electrodes for barrier‐free two‐dimensional semiconductor contacts
Abstract Metal–semiconductor contacts are crucial components in semiconductor devices. Ultrathin two‐dimensional transition‐metal dichalcogenide semiconductors can sustain transistor scaling for next‐generation integrated circuits. However, their performance is often degraded by conventional metal d...
| Main Authors: | , , , , , , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
Wiley
2024-01-01
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| Series: | InfoMat |
| Subjects: | |
| Online Access: | https://doi.org/10.1002/inf2.12491 |