Three-beam convergent-beam electron diffraction for measuring crystallographic phases

Three-beam convergent-beam electron diffraction for measuring crystallographic phases

Under almost all circumstances, electron diffraction patterns contain information about the phases of structure factors, a consequence of the short wavelength of an electron and its strong Coulombic interaction with matter. However, extracting this information remains a challenge and no generic meth...

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Bibliographic Details
Main Authors: Yueming Guo, Philip N. H. Nakashima, Joanne Etheridge
Format: Article
Language:English
Published: International Union of Crystallography 2018-11-01
Series:IUCrJ
Subjects:
crystallographic phase problem
three-phase invariants
convergent-beam electron diffraction
structure determination
enantiomorph ambiguity
nanocrystals
dynamical studies
multiple scattering
Online Access:http://scripts.iucr.org/cgi-bin/paper?S2052252518012216

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http://scripts.iucr.org/cgi-bin/paper?S2052252518012216

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