An Integrated Novel Framework for Coping Missing Values Imputation and Classification

This work presents an integrated framework for imputation of missing values and prediction of class label of unseen samples by using the best features of rule based inductive decision tree (DT) and Support Vector Machine (SVM) classifier (DT-SVM). In this work, the decision tree is used for imputati...

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Bibliographic Details
Main Authors: Monalisa Jena, Satchidananda Dehuri
Format: Article
Language:English
Published: IEEE 2022-01-01
Series:IEEE Access
Subjects:
Online Access:https://ieeexplore.ieee.org/document/9810963/