High-fidelity nano-FTIR spectroscopy by on-pixel normalization of signal harmonics

High-fidelity nano-FTIR spectroscopy by on-pixel normalization of signal harmonics

Scattering-type scanning near-field optical microscopy (s-SNOM) and Fourier transform infrared nanospectroscopy (nano-FTIR) are emerging tools for physical and chemical nanocharacterization of organic and inorganic composite materials. Being based on (i) diffraction-limited illumination of a scannin...

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Bibliographic Details
Main Authors: Mester Lars, Govyadinov Alexander A., Hillenbrand Rainer
Format: Article
Language:English
Published: De Gruyter 2021-12-01
Series:Nanophotonics
Subjects:
far-field reflection
infrared spectroscopy
nano-ftir
nanoscale materials
s-snom
Online Access:https://doi.org/10.1515/nanoph-2021-0565

Internet

https://doi.org/10.1515/nanoph-2021-0565

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